Scanning Electron Microscopy: Basic Function

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Рецензии

4.8 (оценок: 1,881)
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  • 4 stars
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  • 3 stars
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AS
22 авг. 2020 г.

Hello everyone,\n\nI want to thank you all for giving me the opportunity to learn about nanotechnology from the best. The course was very interesting and I really enjoy it. Thank you very much!

MS
1 дек. 2019 г.

This course was very helpful to understand the basic fabrication techniques for making micro and nanodevices. I can confidently use equipment in my laboratory after doing this course. Thank you

Из урока
Nano Measurement and Characterization Tools: Scanning Electron Microscopy and Energy-Dispersive X-ray Spectroscopy

Преподаватели

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    Nan M. Jokerst

    J. A. Jones Professor of Electrical and Computer Engineering
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    Carrie Donley

    Director of CHANL (Chapel Hill Analytical and Nanofabrication Laboratory)
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    James Cahoon

    Assistant Professor
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    Jacob Jones

    Professor

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