Micro Computed Tomography: Measurement Demonstration

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Из курса от партнера Duke University
Nanotechnology: A Maker’s Course
282 оценки
Duke University
282 оценки
Из урока
Nano Measurement and Characterization Tools: X-ray and Optical Characterization
In this module, we will see demonstrations of micro-computed tomography, X-ray photoelectron spectroscopy, and optical spectroscopy. You will learn the basic function of the equipment and how samples are prepared and measured.

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  • Nan M. Jokerst
    Nan M. Jokerst
    J. A. Jones Professor of Electrical and Computer Engineering
    Electrical and Computer Engineering, Duke University
  • Carrie Donley
    Carrie Donley
    Director of CHANL (Chapel Hill Analytical and Nanofabrication Laboratory)
    Applied Physical Sciences, UNC Chapel Hill
  • James Cahoon
    James Cahoon
    Assistant Professor
    Chemistry, UNC Chapel Hill
  • Jacob Jones
    Jacob Jones
    Professor
    Materials Science and Engineering, North Carolina State University

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